A unique march test algorithm for the wide spread of realistic memory faults in SRAMs

被引：0
|
作者：
Benso, A. [1 ]
Bosio, A. [1 ]
Di Carlo, S. [1 ]
Di Natale, G. [1 ]
Prinetto, P. [1 ]
机构：
[1] Politecn Torino, Dipartimento Automat & Informat, I-10129 Turin, Italy
来源：
PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS | 2006年
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D O I：
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Among the different types of algorithms proposed to test Static Random Access Memories (SRAMs), March Tests have proven to be faster, simpler and regularly structured. A large number of March Tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of fault, making a key hurdle the generation of new march tests. The aim of this paper is to target the whole set of realistic fault model and to provide a unique march test able to reduce the test complexity of 15.4% than state-of-the-art march algorithm.
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页码：157 / +
页数：2
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