A 22n March test for realistic static linked faults in SRAMs

被引：0
|
作者：
Benso, A. [1 ]
Bosio, A. [1 ]
Di Carlo, S. [1 ]
Di Natale, G. [1 ]
Prinetto, P. [1 ]
机构：
[1] Politecn Torino, Dipartimento Automat & Informat, Turin, Italy
来源：
ETS 2006: ELEVENTH IEEE EUROPEAN TEST SYMPOSIUM, PROCEEDINGS | 2006年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. Although several March Tests have been developed for the wide memory faults spread, a few of them are able to detect linked faults. In the present paper March AB, a March Test targeting the set of realistic memory linked fault is presented Comparison results show that the proposed March Test provides the same fault coverage of already published algorithms but, it reduces the test complexity and therefore the test time. Moreover, a complete taxonomy of linked faults will be presented.
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页码：49 / +
页数：2
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