March LR: A test for realistic linked faults

被引：66
|
作者：
vandeGoor, AJ [1 ]
Gaydadjiev, GN [1 ]
Yarmolik, VN [1 ]
Mikitjuk, VG [1 ]
机构：
[1] DELFT UNIV TECHNOL,DEPT ELECT ENGN,2628 CD DELFT,NETHERLANDS
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
memory fault models; disturb faults; realistic linked faults; fault coverage; test length; march tests;
D O I：
10.1109/VTEST.1996.510868
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：272 / 280
页数：9
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