A unique march test algorithm for the wide spread of realistic memory faults in SRAMs

被引：0

作者：

Benso, A. ^{[1
]}

Bosio, A. ^{[1
]}

Di Carlo, S. ^{[1
]}

Di Natale, G. ^{[1
]}

Prinetto, P. ^{[1
]}

机构：

[1] Politecn Torino, Dipartimento Automat & Informat, I-10129 Turin, Italy

来源：

PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS | 2006年

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D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Among the different types of algorithms proposed to test Static Random Access Memories (SRAMs), March Tests have proven to be faster, simpler and regularly structured. A large number of March Tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of fault, making a key hurdle the generation of new march tests. The aim of this paper is to target the whole set of realistic fault model and to provide a unique march test able to reduce the test complexity of 15.4% than state-of-the-art march algorithm.

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页码：157 / +

页数：2