Study of the Scandate Cathode Properties from I-V Characteristics

被引：0
|
作者：
Shao, WenSheng [1 ]
Zhang, Ke [1 ]
Gao, YuJuan [1 ]
机构：
[1] Beijing Vacuum Elect Res Inst, Beijing 100015, Peoples R China
来源：
2014 TENTH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE (IVESC) | 2014年
关键词：
DIODES;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Scandate cathode is the most promising cathode type which can be utilized in THz devices. There is a wide transition region in the I-V characteristics of scandate cathode. The low slope and dual slope in the I-V characteristics according with Child-Langmuir law will be discussed in this paper.
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页数：2
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