Normally-off vertical-type mesa-gate GaN MOSFET

被引:5
|
作者
Won, Chul-Ho [1 ]
Kim, Ki-Won [2 ]
Kim, Dong-Seok [1 ]
Kang, Hee-Sung [1 ]
Im, Ki-Sik [1 ]
Jo, Young-Woo [1 ]
Kim, Do-Kywn [1 ]
Kim, Ryun-Hwi [1 ]
Lee, Jung-Hee [1 ]
机构
[1] Kyungpook Natl Univ, Sch Elect Engn, Taegu, South Korea
[2] SK Hynix, R&D Div, Inchon, South Korea
基金
新加坡国家研究基金会;
关键词
ALGAN/GAN HEMT; VOLTAGE; MODE;
D O I
10.1049/el.2014.1692
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A vertical-type mesa-gate GaN metal-oxide semiconductor field-effect transistor (MOSFET) has been fabricated. The mesa-gate structure can be easily achieved by a single deep etch to the n(+)-GaN which is the drain of the device, whereas the trench-gate structure, the commonly used structure for the vertical-type MOSFETs, requires an additional etching process to define the gate region. The mesa-gate GaN MOSFET exhibited a normally-off operation with the threshold voltage of 3 V, a normalised drain current of similar to 55 mA/mm and a high on/off current ratio of 10(8).
引用
收藏
页码:1749 / 1750
页数:2
相关论文
共 50 条
  • [31] Capacitance and Mobility Evaluation for Normally-Off Fully-Vertical GaN FinFETs
    Gribisch, Philipp
    Carrascon, Rosalia Delgado
    Darakchieva, Vanya
    Lind, Erik
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (08) : 4101 - 4107
  • [32] Normally-off GaN-HEMTs with p-type gate: Off-state degradation, forward gate stress and ESD failure
    Meneghini, M.
    Hilt, O.
    Fleury, C.
    Silvestri, R.
    Capriotti, M.
    Strasser, G.
    Pogany, D.
    Bahat-Treidel, E.
    Brunner, F.
    Knauer, A.
    Wuerfl, J.
    Rossetto, I.
    Zanoni, E.
    Meneghesso, G.
    Dalcanale, S.
    MICROELECTRONICS RELIABILITY, 2016, 58 : 177 - 184
  • [33] Design of Hybrid Schottky-Ohmic Gate in Normally-Off p-GaN Gate AlGaN/GaN HEMTs
    Tsai, Wen-Shiuan
    Qin, Zhen-Wei
    Hsin, Yue-Ming
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2021, 10 (12)
  • [34] AlN/GaN Heterostructures for Normally-Off Transistors
    Zhuravlev, K. S.
    Malin, T. V.
    Mansurov, V. G.
    Tereshenko, O. E.
    Abgaryan, K. K.
    Reviznikov, D. L.
    Zemlyakov, V. E.
    Egorkin, V. I.
    Parnes, Ya. M.
    Tikhomirov, V. G.
    Prosvirin, I. P.
    SEMICONDUCTORS, 2017, 51 (03) : 379 - 386
  • [35] Normally-off GaN MOSFETs on insulating substrate
    Kim, Dong-Seok
    Im, Ki-Sik
    Kim, Ki-Won
    Kang, Hee-Sung
    Kim, Do-Kywn
    Chang, Sung-Jae
    Bae, Youngho
    Hahm, Sung-Ho
    Cristoloveanu, Sorin
    Lee, Jung-Hee
    SOLID-STATE ELECTRONICS, 2013, 90 : 79 - 85
  • [36] Normally-off GaN Transistors for Power Applications
    Hilt, O.
    Bahat-Treidel, E.
    Brunner, F.
    Knauer, A.
    Zhytnytska, R.
    Kotara, P.
    Wuerfl, J.
    MICROTHERM' 2013 - MICROTECHNOLOGY AND THERMAL PROBLEMS IN ELECTRONICS, 2014, 494
  • [37] AlN/GaN heterostructures for normally-off transistors
    K. S. Zhuravlev
    T. V. Malin
    V. G. Mansurov
    O. E. Tereshenko
    K. K. Abgaryan
    D. L. Reviznikov
    V. E. Zemlyakov
    V. I. Egorkin
    Ya. M. Parnes
    V. G. Tikhomirov
    I. P. Prosvirin
    Semiconductors, 2017, 51 : 379 - 386
  • [38] Threshold Voltage Modeling of GaN Based Normally-Off Tri-gate Transistor
    Yadav, Chandan
    Kushwaha, Pragya
    Agarwal, Harshit
    Chauhan, Yogesh Singh
    2014 ANNUAL IEEE INDIA CONFERENCE (INDICON), 2014,
  • [39] High Power Normally-OFF GaN/AlGaN HEMT with Regrown p Type GaN
    Rolland, Gwen
    Rodriguez, Christophe
    Gomme, Guillaume
    Boucherif, Abderrahim
    Chakroun, Ahmed
    Bouchilaoun, Meriem
    Pepin, Marie Clara
    El Hamidi, Faissal
    Maher, Soundos
    Ares, Richard
    MacElwee, Tom
    Maher, Hassan
    ENERGIES, 2021, 14 (19)
  • [40] Normally-off dual gate AlGaN/GaN MISFET with selective area-recessed floating gate
    Ahn, Ho-Kyun
    Kim, Zin-Sig
    Bae, Sung-Bum
    Kim, Hae-Cheon
    Kang, Dong-Min
    Kim, Sung-Il
    Lee, Jong-Min
    Min, Byoung-Gue
    Yoon, Hyoung-Sup
    Lim, Jong-Won
    Kwon, Yong-Hwan
    Nam, Eun-Soo
    Park, Hyung-Moo
    Kim, Hyun-Seok
    Lee, Jung-Hee
    SOLID-STATE ELECTRONICS, 2014, 95 : 42 - 45