On combining fault classification and error propagation analysis in RT-level dependability evaluation

被引：4
|
作者：
Ammari, A [1 ]
Hadjiat, K [1 ]
Leveugle, R [1 ]
机构：
[1] TIMA Lab, F-38031 Grenoble, France
来源：
10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/OLT.2004.1319692
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Early analysis of the functional impact of faults aims either at classifying the faults according to their main potential effect, or at analyzing more in depth the error propagation paths in the circuit. This paper presents the results of extensive SEU-like fault injections performed on a VHDL model of the 8051 micro-controller. The advantage of combining the two types of analyses and the impact of the workload are discussed.
引用
收藏
页码：227 / 232
页数：6
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