Enhancement-mode GaAs n-channel MOSFET

被引:51
|
作者
Rajagopalan, Karthik [1 ]
Abrokwah, Jonathan [1 ]
Droopad, Ravi [1 ]
Passlack, Matthias [1 ]
机构
[1] Freescale Semicond Inc, Tempe, AZ 85284 USA
关键词
compound semiconductor; enhancement model; GaAs; high-mobility channel; MOSFETs;
D O I
10.1109/LED.2006.886319
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This letter introduces the first enhancement-mode GaAs n-channel MOSFETs with a high channel mobility and an unpinned Fermi level at the oxide/GaAs interface. The NMOS-FETs feature an In0.3Ga0.7As channel layer, a channel mobility of up to 6207 cm(2)/V (.) s, and a dielectric stack thickness of 13.1-18.7 nm. Enhancement-mode NMOSFETs with a gate length of 1 mu m, a source/drain spacing of 3 mu m, and a threshold voltage of 0.05 V show a saturation current, transconductance, ON-resistance, and subthreshold swing of 243 mA/mm, 81 mS/mm, 8.0 Omega (.) mm, and 162 mV/dec, respectively.
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页码:959 / 962
页数:4
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