At-Speed Current Testing for Fault Diagnosis of Analogue Circuits

被引：0
|
作者：
Guo, Chaoyou [1 ]
Ouyang, Guangyao [1 ]
Li, Yanfei [1 ]
机构：
[1] Naval Univ Engn, Coll Naval Architecture & Power, Wuhan, Peoples R China
来源：
PROCEEDINGS OF 2010 3RD IEEE INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND INFORMATION TECHNOLOGY (ICCSIT 2010), VOL 7 | 2010年
关键词：
supply current testing; At-Speed Current testing; detect faults; analogue circuit; artificial immune system;
D O I：
10.1109/ICCSIT.2010.5565152
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
The At-Speed Current testing (IDDA) is adopted to detect faults for analogue circuits in this paper. The scheme of IDDA for analogue circuits is proposed that an input vector pair (V-0, V-1) repeats k times is applied to circuits under test enable a low-cost ATE or a waveform sensor to measure the average current or the current waveform. And a fault localization method for analogue circuits based on Artificial Immune System (AIS) was presented. The average current of IDDA is served as input parameters of AIS classifier to classify the different fault types. The PSPICE simulation results of continuous-time state-variable filter (ITC'97 set of benchmark circuits) indicate that IDDA is extremely effective to detect faults for analogue circuits.
引用
收藏
页码：326 / 328
页数：3
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