At-speed current test for testing AT89C51 microprocessors

被引：0
|
作者：
Xun, Qinglai [1 ]
Kuang, Jishun [1 ]
Min, Yinghua [2 ]
机构：
[1] College of Computer and Communication, Hunan University, Changsha 410082, China
[2] Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080, China
来源：
Jisuanji Yanjiu yu Fazhan/Computer Research and Development | 2007年 / 44卷 / 03期
关键词：
13;
D O I：
10.1360/crad20070317
中图分类号：
学科分类号：
摘要：
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页码：479 / 486
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