A high-precision X-ray beam-position and profile monitor for synchrotron beamlines

被引：14
|
作者：
van Silfhout, RG [1 ]
机构：
[1] DESY, EMBL, D-22603 Hamburg, Germany
来源：
JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷
关键词：
X-ray beam-position monitors;
D O I：
10.1107/S0909049599010596
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A novel monitor for X-ray beam position, intensity and profile is presented. This diagnostic instrument is based on a commercial photodiode array which detects X-rays scattered diffusely from a featureless foil. The typical accuracy with which the beam position is determined is 1 mu m. Although initially conceived for the characterization of 'white' synchrotron radiation, this monitor has proven to be suitable for monochromatic radiation as well. hence providing a single solution to the task of beam characterization along the X-ray beam path, from source to sample.
引用
收藏
页码：1071 / 1075
页数：5
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