Permanent Wafer Bonding and Temporary Wafer Bonding/De-Bonding Technology Using Temperature Resistant Polymers

被引:11
|
作者
Ishida, Hiroyuki [1 ]
Lutter, Stefan [2 ]
机构
[1] SUSS MicroTec KK, Bonder Div, Midori Ku, Yokohama, Kanagawa 2260006, Japan
[2] A SUSS MicroTec AG Co, SUSS MicroTec Lithog GmbH, Bonder Div, D-75447 Sternenfels, Germany
关键词
wafer bonding; temporary bonding; de-bonding; silicone; polyimide; MEMS; 3D stacking;
D O I
10.2494/photopolymer.27.173
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
There can be two kinds of de-bonding options in the aspect of the releasing interface, one is carrier release and the other is device wafer release. Thermoplastic adhesives are used in most cases for carrier release because the materials can easily be cleaned by solvent. On the other hand, device wafer release is usually selected for thermoset adhesives, which is difficult to remove by solvent. © 2014SPST.
引用
收藏
页码:173 / 176
页数:4
相关论文
共 50 条
  • [1] Temporary Bonding/De-Bonding and Permanent Wafer Bonding Solutions for 3D Integration
    Ishida, Hiroyuki
    Sood, Sumant
    Rosenthal, Christopher
    Lutter, Stefan
    [J]. 2012 2ND IEEE CPMT SYMPOSIUM JAPAN, 2012,
  • [2] Temporary Handling Technology for Advanced Wafer Level Packaging Applications based on Adhesive Bonding and Laser Assisted De-Bonding
    Zoschke, Kai
    Fischer, Thorsten
    Oppermann, Hermann
    Lang, Klaus-Dieter
    [J]. 2014 IEEE 16TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2014, : 209 - 214
  • [3] Temporary Handling Technology by Polyimide based Adhesive Bonding and Laser assisted De-bonding
    Zoschke, Kai
    Wegner, Matthias
    Fischer, Thorsten
    Lang, Klaus-Dieter
    [J]. 2016 6TH ELECTRONIC SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC), 2016,
  • [4] Capping Technologies for Wafer Level MEMS Packaging based on Permanent and Temporary Wafer Bonding
    Zoschke, K.
    Wilke, M.
    Wegner, M.
    Kaletta, K.
    Manier, C. -A.
    Oppermann, H.
    Wietstruck, M.
    Tillack, B.
    Kaynak, M.
    Lang, K. -D.
    [J]. 2014 IEEE 64TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2014, : 1204 - 1211
  • [5] Temporary Wafer Bonding by Polyelectrolyte Interlayers
    Eichler, M.
    Dillmann, H.
    Reim, L. C.
    Thomas, M.
    Klages, C. -P.
    [J]. SEMICONDUCTOR WAFER BONDING 13: SCIENCE, TECHNOLOGY, AND APPLICATIONS, 2014, 64 (05): : 179 - 186
  • [6] High Temperature Resistant Bonding Solutions Enabling Thin Wafer Processing (Characterization of Polyimide Base Temporary Bonding Adhesive for Thinned Wafer Handling)
    Itabashi, Toshiaki
    Zussman, Melvin P.
    [J]. 2010 PROCEEDINGS 60TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2010, : 1877 - 1880
  • [7] Temporary bonding for Chips In Wafer Processing
    Souriau, Jean-Charles
    Jouve, Amandine
    Sillon, Nicolas
    [J]. 2009 11TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC 2009), 2009, : 412 - +
  • [8] Temporary Bonding and De-bonding for Multichip-to-Wafer 3D Integration Process Using Spin-on Glass and Hydrogenated Amorphous Si
    Murugesan, M.
    Fukushima, T.
    Koyanagi, M.
    [J]. 2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 1237 - 1242
  • [9] Study of a Novel Amorphous Silicon Temporary Bonding and Corresponding Laser Assisted De-bonding Technology
    Huang, Yu-Hsiang
    Liang, Hao-Wen
    Cheng, Chuan-An
    Lin, Chien-Hung
    Lee, Chia-Lin
    Yang, Shan-Chun
    Chen, Kuan-Neng
    [J]. 2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 2547 - 2552
  • [10] Room Temperature Wafer Bonding Using Surface Activated Bonding Method
    Taniyama, Shingo
    Wang, Ying-Hui
    Fujino, Masahisa
    Suga, Tadatomo
    [J]. IEEE 9TH VLSI PACKAGING WORKSHOP IN JAPAN, 2008, : 141 - 144