Use of holographic interferometry and electronic speckle pattern interferometry for measurements of dynamic displacements

被引：12
|
作者：
Caponero, MA
Pasqua, P
Paolozzi, A
Peroni, I
机构：
[1] ENEA, Ctr Ric Frascati, I-00044 Frascati, Italy
[2] Univ Rome La Sapienza, Dept Aerospaziale, I-00184 Rome, Italy
来源：
MECHANICAL SYSTEMS AND SIGNAL PROCESSING | 2000年 / 14卷 / 01期
关键词：
D O I：
10.1006/mssp.1999.1265
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
The paper presents the use of Holographic Interferometry and Electronic Speckle Pattern Interferometry for the measurement of dynamic surface displacements. A concise theoretical background of the optical phenomena on which the two techniques are based is given. Analysis of holographic and speckle fringe patterns due to dynamic displacements is introduced as a generalisation of the case of fringe patterns due to static displacements. Experimental results obtained on a turbine blade, an aluminium panel and a microsatellite sandwich structure are reported. (C) 2000 Academic Press.
引用
收藏
页码：49 / 62
页数：14
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