Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

被引：42
|
作者：
García, BB
Moore, AJ
Pérez-López, C
Wang, LL
Tschudi, T
机构：
[1] Ctr Invest Opt, Guanajuato, Mexico
[2] Heriot Watt Univ, Dept Phys, Edinburgh EH14 4AS, Midlothian, Scotland
[3] Inst Appl Phys, D-64289 Darmstadt, Germany
来源：
APPLIED OPTICS | 1999年 / 38卷 / 28期
关键词：
D O I：
10.1364/AO.38.005944
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the +/-1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2 pi/30. (C) 1999 Optical Society of America.
引用
收藏
页码：5944 / 5947
页数：4
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