Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

被引：3
|
作者：
Mihaylova, E [1 ]
Toal, V [1 ]
Guntaka, S [1 ]
Martin, S [1 ]
机构：
[1] Dublin Inst Technol, Ctr Ind & Engn Opt, Dublin 8, Ireland
来源：
12TH INTERNATIONAL SCHOOL ON QUANTUM ELECTRONICS: LASER PHYSICS AND APPLICATIONS | 2003年 / 5226卷
关键词：
ESPI; electronic speckle pattern interferometry; HOE; holographic optical element; photopolymer; NDT; cracks; defects;
D O I：
10.1117/12.519489
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.
引用
收藏
页码：209 / 213
页数：5
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