Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

被引：3
|
作者：
Mihaylova, E [1 ]
Toal, V [1 ]
Guntaka, S [1 ]
Martin, S [1 ]
机构：
[1] Dublin Inst Technol, Ctr Ind & Engn Opt, Dublin 8, Ireland
来源：
12TH INTERNATIONAL SCHOOL ON QUANTUM ELECTRONICS: LASER PHYSICS AND APPLICATIONS | 2003年 / 5226卷
关键词：
ESPI; electronic speckle pattern interferometry; HOE; holographic optical element; photopolymer; NDT; cracks; defects;
D O I：
10.1117/12.519489
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.
引用
收藏
页码：209 / 213
页数：5
相关论文
共 50 条
  • [41] Electronic speckle pattern interferometry for JWST
    Saif, Babak
    Bluth, Marcel
    Eegholm, Bente
    Zukowski, Barbara
    Keski-Kuha, Ritva
    Blake, Peter
    [J]. 2007 IEEE AEROSPACE CONFERENCE, VOLS 1-9, 2007, : 1649 - 1658
  • [42] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY WITH A MICROCOMPUTER
    OREB, BF
    SHARON, B
    HARIHARAN, P
    [J]. APPLIED OPTICS, 1984, 23 (22): : 3940 - 3941
  • [43] Versatile electronic speckle pattern interferometry
    Sirohi, RS
    [J]. LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS, 1998, 3478 : 417 - 420
  • [44] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI)
    SHARP, B
    [J]. OPTICS AND LASERS IN ENGINEERING, 1989, 11 (04) : 241 - 255
  • [45] Holographic optical element based digital speckle pattern shearing interferometer
    Kumar, Manoj
    Shakher, Chandra
    [J]. SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, 2018, 10834
  • [46] Photopolymer diffractive optical elements in electronic speckle pattern shearing interferometry
    Mihaylova, E
    Naydenova, I
    Duignan, B
    Martin, S
    Toal, V
    [J]. OPTICS AND LASERS IN ENGINEERING, 2006, 44 (09) : 965 - 974
  • [47] Optical tomography with parallel projection differences and electronic speckle pattern interferometry
    Meneses-Fabian, C
    Rodriguez-Zurita, G
    Rodriguez-Vera, R
    Vazquez-Castillo, JF
    [J]. OPTICS COMMUNICATIONS, 2003, 228 (4-6) : 201 - 210
  • [48] Quantitative modal analysis using electronic speckle pattern interferometry
    Graham, G
    Petzing, J
    Lucas, M
    Tyrer, J
    [J]. OPTICS AND LASERS IN ENGINEERING, 1999, 31 (02) : 147 - 161
  • [49] VIBRATION PHASE MAPPING USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, OJ
    HOGMOEN, K
    [J]. APPLIED OPTICS, 1976, 15 (11): : 2701 - 2704
  • [50] VIBRATION MODE ANALYSIS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    HURDEN, APM
    [J]. OPTICS AND LASER TECHNOLOGY, 1982, 14 (01): : 21 - 25
12345