ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI)

被引：31
|
作者：
SHARP, B
机构：
来源：
OPTICS AND LASERS IN ENGINEERING | 1989年 / 11卷 / 04期
关键词：
D O I：
10.1016/0143-8166(89)90062-6
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：241 / 255
页数：15
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