Monte Carlo simulation for x-ray detector

被引：1

作者：

Cai, Houzhi ^{[1
,2
]}

Liu, Jinyuan ^{[1
]}

Peng, Xiang ^{[1
,2
]}

Niu, Lihong ^{[1
]}

Peng, Wenda ^{[1
]}

Long, Jinghua ^{[3
]}

机构：

[1] Shenzhen Univ, Minist Educ & Guangdong Prov, Key Lab Optoelect Devices & Syst, Shenzhen 518060, Peoples R China

[2] Tianjin Univ, Coll Precis Instrument & Optoelect Engn, Tianjin 300072, Peoples R China

[3] Shenzhen Univ, Coll Phys, Shenzhen 518060, Peoples R China

来源：

INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2011: ADVANCES IN IMAGING DETECTORS AND APPLICATIONS | 2011年 / 8194卷

关键词：

X-ray detector; microchannel plate; transit time; electron cascade;

D O I：

10.1117/12.900137

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

X-ray detector based on the gated microchannel plate (MCP) is a powerful diagnostic tool for laser-driven inertial confinement fusion and fast Z-pinch experiments. In order to understand the behavior of the MCP used in such detector, the X-ray detector is simulated using the Monte Carlo method. By simulating the electron cascade in the MCP, the relationship between the MCP gain and voltage is obtained. The time, position and energy of the electrons at the MCP output surface are calculated. The transit time distribution, the electron-channel wall collision number distribution and the time distribution of the electrons travel from the MCP to the phosphor screen are given. Spatial resolution simulations of the MCP-based detector are also presented.

引用

页数：8

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