Photoresists for CO2-based next-generation microlithography

被引:0
|
作者
Boggiano, MK [1 ]
Wood, C [1 ]
DeSimone, JM [1 ]
机构
[1] Univ N Carolina, Dept Chem, Chapel Hill, NC USA
关键词
Condensed CO2; addition polymerization; photoresist synthesis; norbornene; free-radical polymerization;
D O I
10.1117/12.599565
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two routes have been pursued toward the fabrication of photoresists for next-generation micro lithography, using condensed carbon dioxide as the processing solvent. Addition polymers containing a norbornyl backbone were synthesized to include fluorinated moieties and chemical amplification switching groups. Other polymers, synthesized free radically in condensed CO2, include partially fluorinated backbones. These materials have been characterized and their lithographic properties evaluated. Solubility differences between exposed and non-exposed resist have been observed in these novel systems, which should provide the necessary contrast for high-resolution imaging.
引用
收藏
页码:487 / 490
页数:4
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