Implicit functional testing for analog circuits

被引：5
|
作者：
Pan, CY [1 ]
Cheng, KT [1 ]
机构：
[1] UNIV CALIF SANTA BARBARA,DEPT ELECT & COMP ENGN,SANTA BARBARA,CA 93106
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510898
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：489 / 494
页数：6
相关论文
共 50 条
  • [21] Selecting measurements to test the functional behavior of analog circuits
    VanSpaandonk, J
    Kevenaar, TAM
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 9 (1-2): : 9 - 18
  • [22] Selecting measurements to test the functional behavior of analog circuits
    Eindhoven Univ of Technology, Eindhoven, Netherlands
    J Electron Test Theory Appl JETTA, 1-2 (9-18):
  • [23] Testing of Analog Circuits using Statistical and Machine Learning Techniques
    Srimani, Supriyo
    Rahaman, Hafizur
    2022 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2022, : 619 - 626
  • [24] Analog Circuits Specifications Testing by Means of Fast Fourier Transformation
    Golonek, Tomasz
    2016 INTERNATIONAL CONFERENCE ON SIGNALS AND ELECTRONIC SYSTEMS (ICSES) PROCEEDINGS, 2016, : 13 - 18
  • [25] Evaluation of signature-based testing of RF/analog circuits
    Zjajo, A
    de Gyvez, JP
    ETS 2005:10TH IEEE EUROPEAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 62 - 67
  • [26] A Wavelet Packets and PCA Based Method for Testing of Analog Circuits
    Zhang, Chaojie
    Liang, Shuhai
    He, Guo
    Yan, Xiaowei
    2009 IEEE AUTOTESTCON, 2009, : 342 - +
  • [27] DIGITAL SYNTHESIZER AIDS TESTING OF COMPLEX ANALOG, DIGITAL CIRCUITS
    KOVALICK, A
    EDN, 1988, 33 (18) : 185 - &
  • [28] Structural fault based specification reduction for testing analog circuits
    Chang, SJ
    Lee, CL
    Chen, JE
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2002, 18 (06): : 571 - 581
  • [29] A Technique of Analog Circuits Testing and Diagnosis Based on Neuromorphic Classifier
    Mosin, Sergey
    ADVANCES IN SIGNAL PROCESSING AND INTELLIGENT RECOGNITION SYSTEMS (SIRS-2015), 2016, 425 : 381 - 393
  • [30] Finding of optimal excitation signal for testing of analog electronic circuits
    Chruszczyk, L.
    Grzechca, D.
    Rutkowski, J.
    BULLETIN OF THE POLISH ACADEMY OF SCIENCES-TECHNICAL SCIENCES, 2007, 55 (03) : 273 - 280
12345