Implicit functional testing for analog circuits

被引:5
|
作者
Pan, CY [1 ]
Cheng, KT [1 ]
机构
[1] UNIV CALIF SANTA BARBARA,DEPT ELECT & COMP ENGN,SANTA BARBARA,CA 93106
关键词
D O I
10.1109/VTEST.1996.510898
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:489 / 494
页数:6
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