共 50 条
- [1] Selecting measurements to test the functional behavior of analog circuits JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 9 (1-2): : 9 - 18
- [2] New techniques for selecting test frequencies for linear analog circuits 2013 IFIP/IEEE 21ST INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC), 2013, : 90 - 95
- [3] Enhancing test effectiveness for analog circuits using synthesized measurements 16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 132 - 137
- [4] Test yield estimation for analog/RF circuits over multiple correlated measurements 2007 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, 2007, : 774 - 783
- [5] Optimization of test signals for analog circuits TELSIKS 2003: 6TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICE, VOLS 1 AND 2, PROCEEDINGS OF PAPERS, 2003, : 133 - 136
- [7] Implicit functional testing for analog circuits 14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 489 - 494
- [8] Functional fault models for analog circuits IEEE DESIGN & TEST OF COMPUTERS, 1998, 15 (02): : 80 - 85
- [9] Criteria for Selecting a Subset of Indirect Measurements for Analog Testing 2016 CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS 2016), 2016, : 13 - 18
- [10] Numerical Test for Stability Evaluation of Analog Circuits 2024 31ST INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM, MIXDES 2024, 2024, : 177 - 182