New Nanoscale Imaging with a Simple Hard X-Ray Nanoslit

被引：1

作者：

Takano, H. ^{[1
]}

Hashimoto, T. ^{[1
]}

Tsuji, T. ^{[1
]}

Koyama, T. ^{[1
]}

Tsusaka, Y. ^{[1
]}

Kagoshima, Y. ^{[1
]}

机构：

[1] Univ Hyogo, Grad Sch Mat Sci, Hyogo 6781297, Japan

来源：

10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2011年 / 1365卷

关键词：

X-ray imaging; metal wire; edge diffraction;

D O I：

10.1063/1.3625363

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A simple and new procedure to measure the optimal intensity distribution of an x-ray wavefield in nanoscale resolution is proposed. A heavy-metal wire can work as a "nanoslit" with a nanoscale aperture size. Its basic function can be described simply with geometrical optics using total reflection. The further function is investigated with numerical calculation of a diffraction edge. In the experiment, Fresnel fringes generated by a rectangular aperture were measured by using a 300-mu m platinum wire as the nanoslit. Its high potential use in imaging applications is discussed.

引用

页码：297 / 300

页数：4

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