A simple hard x-ray "nanoslit" for measuring wavefront intensity

被引：3

作者：

Takano, Hidekazu ^{[1
]}

Hashimoto, Takuto ^{[1
]}

Tsuji, Takuya ^{[1
]}

Koyama, Takahisa ^{[1
]}

Tsusaka, Yoshiyuki ^{[1
]}

Kagoshima, Yasushi ^{[1
]}

机构：

[1] Univ Hyogo, Grad Sch Mat Sci, Kobe, Hyogo 6781297, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 07期

关键词：

D O I：

10.1063/1.3456447

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This "nanoslit" can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-mu m-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved. (C) 2010 American Institute of Physics. [doi:10.1063/1.3456447]

引用

页数：3

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