A simple hard x-ray "nanoslit" for measuring wavefront intensity

被引：3
|
作者：
Takano, Hidekazu [1 ]
Hashimoto, Takuto [1 ]
Tsuji, Takuya [1 ]
Koyama, Takahisa [1 ]
Tsusaka, Yoshiyuki [1 ]
Kagoshima, Yasushi [1 ]
机构：
[1] Univ Hyogo, Grad Sch Mat Sci, Kobe, Hyogo 6781297, Japan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 07期
关键词：
D O I：
10.1063/1.3456447
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This "nanoslit" can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-mu m-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved. (C) 2010 American Institute of Physics. [doi:10.1063/1.3456447]
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页数：3
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