New Nanoscale Imaging with a Simple Hard X-Ray Nanoslit

被引：1
|
作者：
Takano, H. [1 ]
Hashimoto, T. [1 ]
Tsuji, T. [1 ]
Koyama, T. [1 ]
Tsusaka, Y. [1 ]
Kagoshima, Y. [1 ]
机构：
[1] Univ Hyogo, Grad Sch Mat Sci, Hyogo 6781297, Japan
来源：
10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2011年 / 1365卷
关键词：
X-ray imaging; metal wire; edge diffraction;
D O I：
10.1063/1.3625363
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A simple and new procedure to measure the optimal intensity distribution of an x-ray wavefield in nanoscale resolution is proposed. A heavy-metal wire can work as a "nanoslit" with a nanoscale aperture size. Its basic function can be described simply with geometrical optics using total reflection. The further function is investigated with numerical calculation of a diffraction edge. In the experiment, Fresnel fringes generated by a rectangular aperture were measured by using a 300-mu m platinum wire as the nanoslit. Its high potential use in imaging applications is discussed.
引用
收藏
页码：297 / 300
页数：4
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