HIGH-SPEED METAL-FILLING OF THROUGH-SILICON VIAS (TSVs) BY PARALLELIZED MAGNETIC ASSEMBLY OF MICRO-WIRES

被引:0
|
作者
Bleiker, Simon J. [1 ]
Fischer, Andreas C. [1 ,2 ]
Niklaus, Frank [1 ]
机构
[1] KTH Royal Inst Technol, Stockholm, Sweden
[2] Karlsruhe Inst Technol, Karlsruhe, Germany
关键词
HIGH-FREQUENCY APPLICATION; HIGH-ASPECT-RATIO;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work reports a parallelized magnetic assembly method for scalable and cost-effective through-silicon via (TSV) fabrication. Our fabrication approach achieves high throughput by utilizing multiple magnets below the substrate to assemble TSV structures on many dies in parallel. Experimental results show simultaneous filling of four arrays of TSVs on a single substrate, with 100 via-holes each, in less than 20 seconds. We demonstrate that increasing the degree of parallelization by employing more assembly magnets below the substrate has no negative effect on the TSV filling speed or yield, thus enabling scaled-up TSV fabrication on full wafer-level. This method shows potential for industrial application with an estimated throughput of more than 70 wafers per hour in one single fabrication module. Such a TSV fabrication process could offer shorter processing times as well as higher obtainable aspect ratios compared to conventional TSV filling methods.
引用
收藏
页码:577 / 580
页数:4
相关论文
共 34 条
  • [21] Experimental study of current density in copper filling process within deep through-silicon vias with high aspect ratio
    Wang, Feng
    Wang, Fuliang
    Liu, Ximei
    Liu, Jinzhi
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2019, 29 (12)
  • [22] The Demonstration of High-Quality Carbon Nanotubes as Through-Silicon Vias (TSVs) for Three-Dimensional Connection Stacking and Power-Via Technology
    Yen, C-M
    Chang, S-Y
    Chen, K-C
    Feng, Y-J
    Chen, L-H
    Liao, B-Z
    Lee, M-H
    Chen, S-C
    Liao, M-H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (03) : 1600 - 1603
  • [23] High-Speed Through Silicon Via(TSV) Filling Using Diallylamine Additive
    Hayashi, Taro
    Kondo, Kazuo
    Saito, Takeyasu
    Takeuchi, Minoru
    Okamoto, Naoki
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2011, 158 (12) : D715 - D718
  • [24] High-Aspect-Ratio Through Silicon Vias for High-Frequency Application Fabricated by Magnetic Assembly of Gold-Coated Nickel Wires
    Bleiker, Simon J.
    Fischer, Andreas C.
    Shah, Umer
    Somjit, Nutapong
    Haraldsson, Tommy
    Roxhed, Niclas
    Oberhammer, Joachim
    Stemme, Goran
    Niklaus, Frank
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2015, 5 (01): : 21 - 27
  • [25] Design Space Exploration of Through Silicon Vias for High-Speed, Low Loss Vertical Links
    Kumar, Somesh
    Kaur, Sarabjeet
    Bakshi, Mayank
    Bansal, Mohit
    Choudhary, Mohan
    Sharma, Rohit
    2014 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING & SYSTEMS SYMPOSIUM (EDAPS), 2014, : 9 - 12
  • [26] Signal Integrity Design and Analysis of Differential High-Speed Serial Links in Silicon Interposer With Through-Silicon Via
    Cho, Kyungjun
    Kim, Youngwoo
    Lee, Hyunsuk
    Song, Jinwook
    Park, Junyong
    Lee, Seongsoo
    Kim, Subin
    Park, Gapyeol
    Son, Kyungjune
    Kim, Joungho
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2019, 9 (01): : 107 - 121
  • [27] Metal seed layer sputtering on high aspect ratio through-silicon-vias for copper filling electroplating
    Song, Young Sik
    Yim, TaiHong
    Park, Soo-Keun
    Lee, Jae-Ho
    Kim, Jongryoul
    ELECTROCHIMICA ACTA, 2013, 114 : 832 - 837
  • [28] Through-Glass Vias for Glass Interposers and MEMS Packaging Applications Fabricated Using Magnetic Assembly of Microscale Metal Wires
    Laakso, Miku J.
    Bleiker, Simon J.
    Liljeholm, Jessica
    Martensson, Gustaf E.
    Asiatici, Mikhail
    Fischer, Andreas C.
    Stemme, Goran
    Ebefors, Thorbjorn
    Niklaus, Frank
    IEEE ACCESS, 2018, 6 : 44306 - 44317
  • [29] Design of Cu-MWCNT Based Heterogeneous Coaxial through Silicon Vias for High-Speed VLSI Applications
    Rajkumar K.
    Reddy G.U.
    Russian Microelectronics, 2022, 51 (06): : 512 - 520
  • [30] Micro-Cables out of High-Speed Communication Chip through Embedded Wires in the Package Substrate
    Wu, Boping
    2018 IEEE CPMT SYMPOSIUM JAPAN (ICSJ), 2018, : 109 - 112