Model reduction of parasitic coupling networks of mixed-signal VLSI circuits

被引:0
|
作者
Ludwig, Stefan [1 ,2 ]
Mathis, Wolfgang [1 ,3 ]
机构
[1] Leibniz Univ Hannover, Inst Electromagnet Theory, Hannover, Germany
[2] Leibniz Univ Hannover, Electromagnet Theory Grp, Hannover, Germany
[3] Leibniz Univ Hannover, Electromagnet Theory Grp TET, Hannover, Germany
关键词
Modelling; Circuits; INTERCONNECT;
D O I
10.1108/03321641111133253
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Purpose - This paper aims to present a method for the efficient reduction of networks modelling parasitic couplings in very-large-scale integration (VLSI) circuits. Design/methodology/approach - The parasitic effects are modelled by large RLC networks and current sources for the digital switching currents. Based on the determined behaviour of the digital modules, an efficient description of these networks is proposed, which allows for a more efficient model reduction than standard methods. Findings - The proposed method enables a fast and efficient simulation of the parasitic effects. Additionally, an extension of the reduction method to elements, which incorporate some supply voltage dependence to model the internal currents more precisely than independent current sources is presented. Practical implications - The presented method can be applied to large electrical networks, used in the modelling of parasitic effects, for reducing their size. A reduced model is created which can be used in investigations with circuit simulators requiring a lowered computational effort. Originality/value - Contrary to existing methods, the presented method includes the knowledge of the behaviour of the sources in the model to enhance the model reduction process.
引用
收藏
页码:1363 / 1375
页数:13
相关论文
共 50 条
  • [41] Simulation of mixed-signal circuits for crosstalk evaluation
    Trucco, G
    Boselli, G
    Liberali, V
    PROCEEDINGS OF THE 46TH IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS & SYSTEMS, VOLS 1-3, 2003, : 261 - 264
  • [42] Improving the testability of mixed-signal integrated circuits
    Roberts, GW
    PROCEEDINGS OF THE IEEE 1997 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 1997, : 214 - 221
  • [43] Security Aspects of Analog and Mixed-signal Circuits
    Polian, Ilia
    PROCEEDINGS OF THE 2016 IEEE 21ST INTERNATIONAL MIXED-SIGNALS TEST WORKSHOP (IMSTW), 2016,
  • [44] Integrated design and test of mixed-signal circuits
    Engin, N
    Kerkhoff, HG
    Tangelder, RJWT
    Speek, H
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1999, 14 (1-2): : 75 - 83
  • [45] Effective pseudorandom testing of mixed-signal circuits
    Amer, HH
    Salama, AE
    ICM 2003: PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2003, : 400 - 403
  • [46] Benchmark circuits for analog and mixed-signal testing
    Kondagunturi, R
    Bradley, E
    Maggard, K
    Stroud, C
    IEEE SOUTHEASTCON '99, PROCEEDINGS, 1999, : 217 - 220
  • [47] Monitoring properties of analog and mixed-signal circuits
    Maler O.
    Ničković D.
    International Journal on Software Tools for Technology Transfer, 2013, 15 (03) : 247 - 268
  • [48] Influence of clocking strategies on the design of low switching-noise digital and mixed-signal VLSI circuits
    Acosta, AJ
    Jiménez, R
    Juan, J
    Bellido, MJ
    Valencia, M
    INTEGRATED CIRCUIT DESIGN, PROCEEDINGS: POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION, 2000, 1918 : 316 - 326
  • [49] Computer-aided design considerations for mixed-signal coupling in RF integrated circuits
    Verghese, NK
    Allstot, DJ
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (03) : 314 - 323
  • [50] Analog / Mixed-Signal / RF Circuits for Complex Signal Processing
    Kobayashi, Haruo
    Kushita, Nene
    Tran, Minh Tri
    Asami, Koji
    San, Hao
    Kuwana, Anna
    Hatta, Akemi
    2019 IEEE 13TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2019,