X-ray phase tomography with a Talbot interferometer in combination with an X-ray imaging microscope

被引：5
|
作者：
Momose, Atsushi [1 ]
Takeda, Yoshihiro [1 ]
Yashiro, Wataru [1 ]
Takeuchi, Akihisa [2 ]
Suzuki, Yoshio [2 ]
机构：
[1] Univ Tokyo, Dept Adv Mat Sci, Grad Sch Frontier Sci, 5-1-5 Kashiwanoha, Chiba 2778561, Japan
[2] JASRI, SPring 8, Mikazuki, Hyogo 6795198, Japan
来源：
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷
关键词：
D O I：
10.1088/1742-6596/186/1/012044
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
An X-ray Talbot interferometer was combined with an X-ray imaging microscope to generate differential phase contrast. X-ray phase tomography was attained based on the measurement of the differential phase shift using the fringe scanning method. Polymer blend samples were observed and phase separation structures were depicted. The spatial resolution was 1.3 mu m in this test experiment, which will be easily improved by increasing the magnification.
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页数：3
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