Dynamic critical exponent of three-dimensional XY model

The dynamic critical behaviors are determined for the three-dimensional XY model with resistively shunted junction (RSJ) dynamics and time dependent Ginzburg-Landau (TDGL) dynamics. A short-time relaxation method is employed and turned into a standard finite-size scaling from which a precise determination of the critical temperature as well as the dynamic critical exponent can be made. The RSJ and TDGL dynamics are shown to have different dynamic critical behaviors. Comparisons with earlier works are made and discussed. (C) 2000 Elsevier Science B.V. All rights reserved.