Dynamic critical exponent of three-dimensional XY model

被引：3

作者：

Kim, BJ ^{[1
]}

Jensen, LM ^{[1
]}

Minnhagen, P ^{[1
]}

机构：

[1] Umea Univ, Dept Theoret Phys, S-90187 Umea, Sweden

来源：

PHYSICA B | 2000年 / 284卷

关键词：

scaling relations; short-time relaxation; XY model;

D O I：

10.1016/S0921-4526(99)01981-X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The dynamic critical behaviors are determined for the three-dimensional XY model with resistively shunted junction (RSJ) dynamics and time dependent Ginzburg-Landau (TDGL) dynamics. A short-time relaxation method is employed and turned into a standard finite-size scaling from which a precise determination of the critical temperature as well as the dynamic critical exponent can be made. The RSJ and TDGL dynamics are shown to have different dynamic critical behaviors. Comparisons with earlier works are made and discussed. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：413 / 414

页数：2

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