Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips

被引：0
|
作者：
Eisenstein, Alon [1 ]
Goh, M. Cynthia
机构：
[1] Univ Toronto, Dept Chem, Toronto, ON M5S 3H6, Canada
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2012年 / 83卷 / 03期
基金：
加拿大自然科学与工程研究理事会;
关键词：
ENHANCED RAMAN-SPECTROSCOPY; NANOSCALE CHEMICAL-ANALYSIS; RESOLUTION;
D O I：
10.1063/1.3698073
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3698073]
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页数：3
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