Determination of damping force between atomic force microscope tips and sample using an inverse methodology

被引:3
|
作者
Chang, WJ [1 ]
Lin, CM
Lee, JF
Lin, SL
机构
[1] Kun Shan Univ Technol, Dept Engn Mech, Tainan 71003, Taiwan
[2] Wu Feng Inst Technol, Dept Engn Mech, Chiayi 621, Taiwan
[3] Kun Shan Univ Technol, Dept Informat Management, Tainan 71003, Taiwan
关键词
atomic force microscope; inverse vibration problem; conjugate gradient method; interaction force; damping force;
D O I
10.1016/j.physleta.2005.06.005
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In this Letter, the determination of the damping force between the atomic force microscope (AFM) tips and sample is regarded as an inverse vibration problem. The inverse solution methodology based on the conjugate gradient method is presented for estimating the interaction force and the damping force. The method is required to treat the inverse problem using available displacement measurements of AFM cantilever. Numerical results show that the method can accurately estimate the interaction force and the damping force even for problems with error of displacement measurement. In addition, the initial guesses for the interaction force can be arbitrarily chosen and the computing time required for the inverse calculations takes less than one second using a Pentium III-450 MHz PC. (c) 2005 Elsevier B.V. All tights reserved.
引用
收藏
页码:79 / 84
页数:6
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