Emittance study of the high intensity highly charged heavy ion beams extracted from electron cyclotron resonance ion source

被引：2
|
作者：
Fang, X. [1 ]
Sun, L. T. [1 ,2 ,3 ]
Yuan, Y. J. [1 ,2 ]
Qian, C. [1 ,2 ]
Yang, Y. [1 ]
Lu, W. [1 ]
Zhao, H. W. [1 ,2 ]
机构：
[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
[2] Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing 100049, Peoples R China
[3] IMP, Lanzhou 730000, Peoples R China
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2020年 / 91卷 / 01期
关键词：
Electron cyclotron resonance - Cyclotrons - Heavy ions - Ion sources - Phase space methods;
D O I：
10.1063/1.5128638
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
According to the requirements of ion beams extracted from an electron cyclotron resonance ion source transverse phase space coupling research and the afterglow beam property effective measurement, a pepper pot type meter called PEMiL (Pepper Pot Emittance Meter in Lanzhou) has been designed, fabricated, and commissioned to obtain the emittance of high intensity highly charged heavy ion beams. The direct current beam emittance measurement results verify the coupling property caused by the semisolenoid field. This paper also describes the scheme of multiple exposure accumulation which was applied to measure the afterglow beam property, and the transverse phase space distribution of the oxygen afterglow beam which was measured for the first time is presented.
引用
收藏
页数：5
相关论文
共 50 条
  • [21] On the beam emittance/brilliance of highly charged ions extracted from the Frankfurt 14GHz Electron-Cyclotron-Resonance-Ion-Source in standard and enhanced (MD) mode
    Mueller, J. C.
    Doerner, R.
    King, F.
    Schaechter, L.
    Stiebing, K. E.
    XXX INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC, AND ATOMIC COLLISIONS (ICPEAC2017), 2017, 875
  • [22] Production of intense beams of highly charged metallic ions from RIKEN 18 GHz electron cyclotron resonance ion source
    Nakagawa, T
    Arje, J
    Miyazawa, Y
    Hemmi, M
    Chiba, T
    Inabe, N
    Kase, M
    Kageyama, T
    Kamigaito, O
    Kidera, M
    Goto, A
    Yano, Y
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 637 - 639
  • [23] Production of a highly charged uranium ion beam with RIKEN superconducting electron cyclotron resonance ion source
    Higurashi, Y.
    Ohnishi, J.
    Nakagawa, T.
    Haba, H.
    Tamura, M.
    Aihara, T.
    Fujimaki, M.
    Komiyama, M.
    Uchiyama, A.
    Kamigaito, O.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (02):
  • [24] Intense highly charged ion beam production and operation with a superconducting electron cyclotron resonance ion source
    Zhao, H. W.
    Sun, L. T.
    Guo, J. W.
    Lu, W.
    Xie, D. Z.
    Hitz, D.
    Zhang, X. Z.
    Yang, Y.
    PHYSICAL REVIEW ACCELERATORS AND BEAMS, 2017, 20 (09):
  • [25] Development of electron cyclotron resonance heavy ion source
    Bose, DK
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1997, 35 (03) : 135 - 143
  • [26] Effect of electrode for producing the highly charged heavy ions from RIKEN 18 GHz electron cyclotron resonance ion source
    Kurita, T
    Nakagawa, T
    Kidera, M
    Miyazawa, Y
    Hemmi, M
    Chiba, T
    Inabe, N
    Kase, M
    Kageyama, T
    Kamigaito, O
    Goto, A
    Yano, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (6A): : 3707 - 3711
  • [27] Effect of electrode for producing the highly charged heavy ions from RIKEN 18 GHz electron cyclotron resonance ion source
    Kurita, Tetsuro
    Nakagawa, Takahide
    Kidera, Masanori
    Miyazawa, Yoshitoshi
    Hemmi, Masatake
    Chiba, Toshiya
    Inabe, Naohito
    Kase, Masayuki
    Kageyama, Tadashi
    Kamigaito, Osamu
    Goto, Akira
    Yano, Yasushige
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (6 A): : 3707 - 3711
  • [28] Plasma potential and energy spread determination using ion beams extracted from an electron cyclotron resonance source
    Harris, P. R.
    Meyer, F. W.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (02):
  • [29] Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source
    Cao, Y.
    Sun, L. T.
    Ma, L.
    Ma, B. H.
    Wang, H.
    Feng, Y. C.
    Li, J. Y.
    Zhao, H. W.
    Zhang, Z. M.
    Zhang, X. Z.
    He, W.
    Zhao, H. Y.
    Guo, X. H.
    Li, X. X.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (03):
  • [30] Effect of Mid-Electrode Potential on Multi-Charged Ion Beam Extracted from Electron Cyclotron Resonance Ion Source
    Imai, Y.
    Kimura, D.
    Yano, K.
    Kumakura, S.
    Nishiokada, T.
    Sato, F.
    Kato, Y.
    Iida, T.
    Muramatsu, M.
    Kitagawa, A.
    2014 20TH INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY (IIT 2014), 2014,
12345