Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source

被引:4
|
作者
Cao, Y. [1 ]
Sun, L. T. [1 ]
Ma, L. [1 ]
Ma, B. H. [1 ]
Wang, H. [1 ]
Feng, Y. C. [1 ]
Li, J. Y. [1 ]
Zhao, H. W. [1 ]
Zhang, Z. M. [1 ]
Zhang, X. Z. [1 ]
He, W. [1 ]
Zhao, H. Y. [1 ]
Guo, X. H. [1 ]
Li, X. X. [1 ]
机构
[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansuo, Peoples R China
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2006年 / 77卷 / 03期
关键词
D O I
10.1063/1.2172357
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modem Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article. (c) 2006 American Institute of Physics.
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页数:3
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