On the beam emittance/brilliance of highly charged ions extracted from the Frankfurt 14GHz Electron-Cyclotron-Resonance-Ion-Source in standard and enhanced (MD) mode

被引:1
|
作者
Mueller, J. C. [1 ]
Doerner, R. [1 ]
King, F. [1 ]
Schaechter, L. [2 ]
Stiebing, K. E. [1 ]
机构
[1] Goethe Univ, Inst Nucl Phys, Max von Laue Str 1, D-60438 Frankfurt, Germany
[2] Natl Inst Phys & Nucl Engn, Bucharest 77425, Romania
关键词
METAL-DIELECTRIC STRUCTURE;
D O I
10.1088/1742-6596/875/10/092002
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Electron Cyclotron Resonance Ion Sources (ECRIS) provide only moderate emittances as compared to other types of ion sources. Besides considerable effort to improve the total output of ECRIS's by dedicated modifications (gas mixing, wall coating etc.), it is important to also determine the influence of such improvements on the beam quality. In this contribution dedicated experiments on the influence of the MD method [1] on the emittance/brilliance of extracted ion beams from the Frankfurt 14GHz ECRIS are presented.
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