Development of a low temperature scanning probe microscope

被引：6
|
作者：
Saitoh, Kohta [1 ]
Hayashi, Kenichi [1 ]
Shibayama, Yoshiyuki [1 ]
Shirahama, Keiya [1 ]
机构：
[1] Keio Univ, Dept Phys, Yokohama, Kanagawa 2238522, Japan
来源：
JOURNAL OF LOW TEMPERATURE PHYSICS | 2008年 / 150卷 / 3-4期
关键词：
low temperature instrumentation and new techniques;
D O I：
10.1007/s10909-007-9584-6
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.
引用
收藏
页码：561 / 566
页数：6
相关论文
共 50 条
  • [21] Improved controlled atmosphere high temperature scanning probe microscope
    Hansen, K. V.
    Wu, Y.
    Jacobsen, T.
    Mogensen, M. B.
    Kuhn, L. Theil
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (07):
  • [22] A New Generation of Variable Temperature Scanning Probe Microscope for Spectroscopy
    Chomiuk, P.
    Uder, B.
    Bettac, A.
    Koeble, J.
    Troeppner, C.
    ACTA PHYSICA POLONICA A, 2014, 125 (04) : 1049 - 1051
  • [23] A scanning probe microscope for studying electron transport at low temperatures
    Zhukov, A. A.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2008, 51 (01) : 130 - 134
  • [24] A scanning probe microscope for studying electron transport at low temperatures
    A. A. Zhukov
    Instruments and Experimental Techniques, 2008, 51 : 130 - 134
  • [25] New development of nanoscale spectroscopy using scanning probe microscope
    Minn, Khant
    Birmingham, Blake
    Zhang, Zhenrong
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (03):
  • [26] Development of key parts for large scale scanning probe microscope
    Zhu, JJ
    Liu, AY
    Zhou, Q
    Wang, H
    Lu, ZH
    PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 3, 2004, : 522 - 526
  • [27] New development of nanoscale spectroscopy using scanning probe microscope
    Minn, Khant
    Birmingham, Blake
    Zhang, Zhenrong
    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2020, 38 (03):
  • [28] Development of a cryogen-free sub-3 K low-temperature scanning probe microscope by remote liquefaction scheme
    Ma, Ruisong
    Li, Hao
    Shi, Chenshuai
    Wang, Fan
    Lei, Le
    Huang, Yuanzhi
    Liu, Yani
    Shan, Huan
    Liu, Li
    Huang, Shesong
    Niu, Zhi-Chuan
    Huan, Qing
    Gao, Hong-Jun
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2023, 94 (09):
  • [29] A combined scanning probe microscope
    Lányi, S
    Hruskovic, M
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (08): : 2923 - 2927
  • [30] Metrological scanning probe microscope
    Dorozhovets, N.
    Hausotte, T.
    Manske, E.
    Jaeger, G.
    Hofmann, N.
    OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY, 2006, 6188
12345