Development of a low temperature scanning probe microscope

被引：6

作者：

Saitoh, Kohta ^{[1
]}

Hayashi, Kenichi ^{[1
]}

Shibayama, Yoshiyuki ^{[1
]}

Shirahama, Keiya ^{[1
]}

机构：

[1] Keio Univ, Dept Phys, Yokohama, Kanagawa 2238522, Japan

来源：

JOURNAL OF LOW TEMPERATURE PHYSICS | 2008年 / 150卷 / 3-4期

关键词：

low temperature instrumentation and new techniques;

D O I：

10.1007/s10909-007-9584-6

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A scanning probe microscope working at low temperatures is developed. Frequency-modulation atomic force microscopy technique with a quartz tuning fork is employed for low temperatures use. Topographic imaging of a diffraction grating is successfully performed down to 1.3 K.

引用

页码：561 / 566

页数：6

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