Generation of Stochastic Interconnect Responses via Gaussian Process Latent Variable Models

被引:1
|
作者
De Ridder, Simon [1 ]
Deschrijver, Dirk [1 ]
Manfredi, Paolo [2 ]
Dhaene, Tom [1 ]
Vande Ginste, Dries [1 ]
机构
[1] Univ Ghent, Imec, Dept Informat Technol, B-9000 Ghent, Belgium
[2] Politecn Torino, Dept Elect & Telecommun, I-10129 Turin, Italy
关键词
Gaussian process latent variable model (GP-LVM); generative models; high-speed connectors and links; statistical link analysis; stochastic modeling; UNCERTAINTY QUANTIFICATION;
D O I
10.1109/TEMC.2018.2830104
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We introduce a novel generative model for stochastic device responses using limited available data. This model is oblivious to any varying design parameters or their distribution and only requires a small set of "training" responses. Using this model, new responses are efficiently generated whose distribution closely matches that of the real data, e.g., for use in Monte-Carlo-like analyses. The modeling methodology consists of a vector fitting step, where device responses are represented by a rational model, followed by the optimization of a Gaussian process latent variable model. Passivity is guaranteed by a posteriori discarding of nonpassive responses. The novel model is shown to considerably outperform a previous generative model, as evidenced by comparing accuracies of distribution estimation for the case of differential-to-common mode conversion in two coupled microstrip lines.
引用
收藏
页码:582 / 585
页数:4
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