Thermally stimulated diffusion of Mn through thin layers of GaAs has been studied by x-ray photoemission. (Ga, Mn) As samples with 5 at% Mn were capped with 4, 6 and 8 monolayer (ML) GaAs, and Mn diffusing through the GaAs was trapped on the surface by means of amorphous As. It was found that the out-diffusion is completely suppressed for an 8 ML thick GaAs film. The short diffusion length is attributed to an electrostatic barrier formed at the (Ga, Mn) As/GaAs interface.
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Royal Inst Technol KTH, Appl Mat Phys, Dept Mat Sci & Engn, SE-10044 Stockholm, SwedenRoyal Inst Technol KTH, Appl Mat Phys, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
Baykov, V. I.
Korzhavyi, P. A.
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Royal Inst Technol KTH, Appl Mat Phys, Dept Mat Sci & Engn, SE-10044 Stockholm, SwedenRoyal Inst Technol KTH, Appl Mat Phys, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
Korzhavyi, P. A.
Johansson, B.
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Royal Inst Technol KTH, Appl Mat Phys, Dept Mat Sci & Engn, SE-10044 Stockholm, SwedenRoyal Inst Technol KTH, Appl Mat Phys, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden