共 50 条
- [21] A NEW STRATEGY FOR SMT INSPECTION AND PROCESS-CONTROL PROCEEDINGS OF THE TECHNICAL CONFERENCE : NINTH ANNUAL INTERNATIONAL ELECTRONICS PACKAGING CONFERENCE, VOLS 1 AND 2, 1989, : 1128 - 1137
- [22] SMOOTHNESS MEASUREMENT AS A MEANS FOR INSPECTION AND CONTROL OF THE PRODUCTION PROCESS PAPIER, 1983, 37 (01): : 1 - 10
- [23] Solder paste inspection: Process control for defect reduction ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY, 1997, : 1036 - 1036
- [24] Statistical Process Control Automation in the Final Inspection Process: An Industrial Case Study 2016 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM), 2016, : 876 - 880
- [26] Advanced process control based on lithographic defect inspection and reduction 2000 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP, 2000, : 33 - 40
- [27] GERT ANALYSIS OF CHAIN SAMPLING INSPECTION PROCESS CONTROL PLAN INTERNATIONAL JOURNAL OF AGRICULTURAL AND STATISTICAL SCIENCES, 2012, 8 (01): : 31 - 40
- [28] Introduction of a High Throughput SPM for Defect Inspection and Process Control METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXVII, 2013, 8681
- [29] Advances in ultrasonic inspection methods for PIM process monitoring and control NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS VIII, 1998, : 347 - 352
- [30] ASSISTIVE AUGMENTED ENVIRONMENT IN QUALITY INSPECTION AND STATISTICAL PROCESS CONTROL 2016 INTERNATIONAL CONFERENCE ON PRODUCTION RESEARCH - REGIONAL CONFERENCE AFRICA, EUROPE AND THE MIDDLE EAST (ICPR-AEM 2016) AND 4TH INTERNATIONAL CONFERENCE ON QUALITY AND INNOVATION IN ENGINEERING AND MANAGEMENT (QIEM 2016), 2016, : 493 - 498