A NEW STRATEGY FOR SMT INSPECTION AND PROCESS-CONTROL

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作者：

MALLOY, D

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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引用

页码：1128 / 1137

页数：10

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[1] AN INTEGRATED STRATEGY FOR SMT INSPECTION, TEST, AND PROCESS-CONTROL
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[2] INSPECTION OF PROCESS-CONTROL COMPUTERS
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[3] RADIONUCLIDES FOR PROCESS-CONTROL AND INSPECTION
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[4] BOLIDEN ADOPTS NEW PROCESS-CONTROL STRATEGY
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[5] USING STATISTICAL PROCESS-CONTROL AND PROCESS DISSECTION TO CONTROL AND IMPROVE SMT
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[J]. MICROELECTRONIC PACKAGING TECHNOLOGY: MATERIALS AND PROCESSES, 1989, : 459 - 479
[6] PROCESS-CONTROL BY AUTOMATED IN PROCESS WAFER INSPECTION
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[J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 470 : 253 - 260
[7] PHOTOLUMINESCENCE MAPPING IN INSPECTION AND PROCESS-CONTROL
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[8] COMPOSTING PROCESS-CONTROL STRATEGY
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[9] PROCESS-CONTROL STRATEGY WIDENS
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[10] NEW METHOD OF PROCESS-CONTROL
不详
[J]. SUGAR JOURNAL, 1984, 46 (09): : 18 - 18