Superconducting multilayer structures with a thick SiO2 dielectric interlayer for multichip modules

被引:0
|
作者
Zhang, GQ [1 ]
Yao, HJ [1 ]
Luo, WA [1 ]
Ang, SS [1 ]
Brown, WD [1 ]
Chan, FT [1 ]
Salamo, GJ [1 ]
机构
[1] Univ Arkansas, Dept Phys, Fayetteville, AR 72701 USA
关键词
multichip module; high temperature superconductor;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the most promising applications for high temperature superconductors (HTSCs) is for use as signal interconnects between bare integrated circuits (ICs) in multichip modules (MCMs). For HTSC MCM and other related electronic applications, it is necessary to fabricate several YBa2Cu3O7-x (YBCO) layers separated by thick low dielectric layers. In this work, YBCO/yttrium stabilized zirconia (YSZ)/SiO2/YSZ/YBCO multilayer structures have been successfully deposited with patterned YBCO layers on single-crystal YSZ substrates. Reactive sputtering technique was used to grow SiO2 layer and ion beam assisted deposition (IBAD) method was used to form biaxially aligned YSZ layers. In contrast to previously reported work, the top YBCO layer did not show any cracking. Using this process, a novel two-layer test vehicle was fabricated. A clock distribution circuit was mounted on the superconducting test vehicle to form a ring oscillator. The functionality of the test vehicle was found to be about 100 MHz.
引用
收藏
页码:1023 / 1025
页数:3
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