Minimizing tip-sample forces in jumping mode atomic force microscopy in liquid

被引：65

作者：

Ortega-Esteban, A. ^{[1
]}

Horcas, I. ^{[2
]}

Hernando-Perez, M. ^{[1
]}

Ares, P. ^{[2
]}

Perez-Berna, A. J. ^{[3
]}

San Martin, C. ^{[3
]}

Carrascosa, J. L. ^{[3
]}

de Pablo, P. J. ^{[1
]}

Gomez-Herrero, J. ^{[1
]}

机构：

[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, Madrid 28049, Spain

[2] Ctr Empresarial Euronova 3, Nanotec Elect SL, Madrid 28760, Spain

[3] Ctr Nacl Biotecnol CNB CSIC, Madrid 28049, Spain

来源：

ULTRAMICROSCOPY | 2012年 / 114卷

关键词：

Atomic force microscopy; Scanning in liquids; Virus; RESOLUTION; MATURATION; VIRUS;

D O I：

10.1016/j.ultramic.2012.01.007

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Control and minimization of tip-sample interaction forces are imperative tasks to maximize the performance of atomic force microscopy. In particular, when imaging soft biological matter in liquids, the cantilever dragging force prevents identification of the tip-sample mechanical contact, resulting in deleterious interaction with the specimen. In this work we present an improved jumping mode procedure that allows detecting the tip-sample contact with high accuracy, thus minimizing the scanning forces (similar to 100 pN) during the approach cycles. To illustrate this method we report images of human adenovirus and T7 bacteriophage particles which are prone to uncontrolled modifications when using conventional jumping mode. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：56 / 61

页数：6

共 50 条

[21] Tip-sample interaction in tapping-mode scanning force microscopy
de Pablo, PJ
Colchero, J
Luna, M
Gómez-Herrero, J
Baró, AM
PHYSICAL REVIEW B, 2000, 61 (20) : 14179 - 14183
[22] Nonlinear tip-sample interactions affecting frequency responses of microcantilevers in tapping mode atomic force microscopy
Hoummady, M
Rochat, E
Farnault, E
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S935 - S938
[23] Quantitative measurement of tip-sample interactions in amplitude modulation atomic force microscopy
Hoelscher, H.
APPLIED PHYSICS LETTERS, 2006, 89 (12)
[24] Inverse calculation of the tip-sample interaction force in atomic force microscopy by the conjugate gradient method
Chang, WJ
Hsu, JC
Lai, TH
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (07) : 1123 - 1126
[25] Effects of atomic arrangement at tip apex and tip-sample distance on atomic force microscopy images: a simulation study
Komiyama, Masaharu
Ohkubo, Shin'ya
Tazawa, Katsuyuki
Tsujimichi, Kazuya
Hirotani, Akiyasu
Kubo, Momoji
Miyamoto, Akira
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1996, 35 (4 A): : 2318 - 2325
[26] Effects of atomic arrangement at tip apex and tip-sample distance on atomic force microscopy images: A simulation study
Komiyama, M
Ohkubo, S
Tazawa, K
Tsujimichi, K
Hirotani, A
Kubo, M
Miyamoto, A
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (4A): : 2318 - 2325
[27] A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy
Giessibl, FJ
APPLIED PHYSICS LETTERS, 2001, 78 (01) : 123 - 125
[28] Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements
Sahin, Ozgur
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (10):
[29] TIP-SAMPLE INTERACTION EFFECTS IN SCANNING-TUNNELING AND ATOMIC-FORCE MICROSCOPY
CIRACI, S
BARATOFF, A
BATRA, IP
PHYSICAL REVIEW B, 1990, 41 (05): : 2763 - 2775
[30] Simulation of tip-sample interaction in the atomic force microscope
Good, BS
Banerjea, A
JOURNAL OF PHYSICS-CONDENSED MATTER, 1996, 8 (10) : 1325 - 1333

← 1 2 3 4 5 →