A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy

被引：197
|
作者：
Giessibl, FJ [1 ]
机构：
[1] Univ Augsburg, Inst Phys Elect Correlat & Magnetism, D-86135 Augsburg, Germany
来源：
APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 01期
关键词：
D O I：
10.1063/1.1335546
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip-sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip-sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency shift Deltaf and tip-sample force gradient k(ts) that simplifies the calculation of FMAFM images is established: Deltaf is a convolution of k(ts) with a semispherical weight function. (C) 2001 American Institute of Physics.
引用
收藏
页码：123 / 125
页数：3
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