共 50 条
- [42] Electrostatic tip-sample interaction in immersion force microscopy of semiconductors PHYSICAL REVIEW B, 1996, 54 (03): : 1478 - 1481
- [43] Apparatus for illuminating the tip-sample interface of an atomic force microscope REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (01): : 94 - 99
- [44] Electrostatic tip-sample interaction in immersion force microscopy of semiconductors Phys Rev B, 3 (1478):
- [45] TIP-SAMPLE INTERACTION FORCES IN SCANNING TUNNELING MICROSCOPY - EFFECTS OF CONTAMINANTS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1340 - 1342
- [46] An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (07):