Analog and mixed signal test techniques for SoCs

被引：0

作者：

Kerkhoff, HG ^{[1
]}

Kaminska, B ^{[1
]}

机构：

[1] Pultron Inc, Montreal, PQ, Canada

来源：

MICROELECTRONICS JOURNAL | 2003年 / 34卷 / 10期

关键词：

D O I：

10.1016/S0026-2692(03)00234-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：887 / 888

页数：2

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