Analog and mixed signal test techniques for SoCs

被引：0
|
作者：
Kerkhoff, HG [1 ]
Kaminska, B [1 ]
机构：
[1] Pultron Inc, Montreal, PQ, Canada
来源：
MICROELECTRONICS JOURNAL | 2003年 / 34卷 / 10期
关键词：
D O I：
10.1016/S0026-2692(03)00234-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：887 / 888
页数：2
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