A compact on-chip ECC for low cost flash memories

被引:23
|
作者
Tanzawa, T
Tanaka, T
Takeuchi, K
Shirota, R
Aritome, S
Watanabe, H
Kemink, G
Shimizu, K
Sato, S
Takeucki, Y
Ohuchi, K
机构
[1] Toshiba Microlectron. Eng. Lab., Toshiba Corporation
[2] Philips Semiconductor, Nijmegen
[3] Tohoku University, Sendai
[4] Toshiba R. and D. Center, Kanagawa
[5] Toshiba Microlectron. Eng. Lab., Toshiba Corporation, Kawasaki
[6] University of Tokyo, Tokyo
关键词
cumulative error rate; flash memory; on-chip ECC; reliability improvement;
D O I
10.1109/4.568829
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A compact on-chip error correcting circuit (ECC) for low cost Flash memories has been developed,The total increase in chip area is 2%, including all cells, sense amplifiers, logic, and wiring associated with the ECC, The proposed on-chip ECC, employing 10 check bits for 512 data bits, has been implemented on an experimental 64M-bit NAND Flash memory, The cumulative sector error rate has been improved from 10(-1) to 10(-10). By transferring read data from the sense amplifiers to the ECC twice, 522-Byte temporary buffers, which are required for the conventional ECC and occupy a large part of the ECC area, have been eliminated, As a result, the area for the circuit has been drastically reduced by a factor of 25, The proposed on-chip ECC has been optimized in consideration of balance between the reliability improvement and the cell area overhead, The power increase has been suppressed to less than 1 mA.
引用
收藏
页码:662 / 669
页数:8
相关论文
共 50 条
  • [21] Leveraging the page buffer data cache for enhanced programmability in NAND flash memories with on-chip microcontrollers
    Kim, Geonu
    [J]. ELECTRONICS LETTERS, 2024, 60 (03)
  • [22] Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories
    Lu, Shyue-Kung
    Zhong, Shang-Xiu
    Hashizume, Masaki
    [J]. 2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS), 2016, : 287 - 292
  • [23] AN ADAPTIVE ECC SCHEME FOR DYNAMIC PROTECTION OF NAND FLASH MEMORIES
    Yuan, Liu
    Liu, Huaida
    Jia, Pingui
    Yang, Yiping
    [J]. 2015 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING (ICASSP), 2015, : 1052 - 1055
  • [24] UVM-based Verification of ECC Module for Flash Memories
    Visalli, Giuseppe
    [J]. 2017 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN (ECCTD), 2017,
  • [25] A 64KB CMOS EEROM WITH ON-CHIP ECC
    MEHROTRA, S
    WU, TC
    CHIU, TL
    PERLEGOS, G
    [J]. ISSCC DIGEST OF TECHNICAL PAPERS, 1984, 27 : 142 - &
  • [26] A superconductive flash digitizer with on-chip memory
    Kaplan, SB
    Bradley, PD
    Brock, DK
    Gaidarenko, D
    Gupta, D
    Li, WQ
    Rylov, SV
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 3020 - 3025
  • [27] On-chip flash memory microcomputers and their applications
    Tatezaki, Jun'ichi
    Asakami, Hiroaki
    Watanabe, Terukazu
    [J]. Hitachi Review, 1999, 48 (02): : 64 - 67
  • [28] On-chip triple-error correction and quadruple-error detection ECC structure for ultra-large, single-chip memories
    Alzahrani, FM
    Chen, T
    [J]. COMPUTERS & ELECTRICAL ENGINEERING, 2000, 26 (05) : 317 - 335
  • [29] Virtualizing on-chip distributed ScratchPad memories for low power and trusted application execution
    Luis Angel D. Bathen
    Dongyun Shin
    Sung-Soo Lim
    Nikil D. Dutt
    [J]. Design Automation for Embedded Systems, 2013, 17 : 377 - 409
  • [30] On-chip spectrometer for low-cost optical coherence tomography
    Nitkowski, Arthur
    Preston, Kyle
    Sherwood-Droz, Nicolas
    Schmidt, Bradley S.
    Hajian, Arsen R.
    [J]. OPTICAL COHERENCE TOMOGRAPHY AND COHERENCE DOMAIN OPTICAL METHODS IN BIOMEDICINE XVIII, 2014, 8934