Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry

被引：0

作者：

Sorokin, L. M. ^{[1
]}

Kyutt, R. N. ^{[1
]}

Ratnikov, V. V. ^{[1
]}

Kalmykov, A. E. ^{[1
]}

机构：

[1] Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia

来源：

TECHNICAL PHYSICS LETTERS | 2021年 / 47卷 / 12期

关键词：

superlattice; CdF2; CaF2; transmission electron microscopy; X-ray diffractometry; CDF2-CAF2; SUPERLATTICES; MBE-GROWTH; CONDUCTIVITY;

D O I：

10.1134/S1063785021080125

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electron microscopy and X-ray diffractometry has been performed. It has been established that the superlattice is in a pseudomorphic state and a lateral inhomogeneity with a fragment size of 10-40 nm has been found. The reason for the broadening of the main and satellite peaks of the superlattice on the diffraction curve (111) has been elucidated.

引用

页码：893 / 896

页数：4

共 48 条

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